Scanning electron microscope (SEM) is a measuring instrument that transforms the secondary electron found on the sample surface into image information and displays it, when focusing an electron beam in vacuum and injecting it into the sample. According to the method and performance of electron beam retrieval, it is largely classified into general-purpose scanning electron microscope and field emission scanning electron microscope (FE-SEM). The FE-SEM, which recently was successfully developed in Korea for the first time, has a high technical barrier, as the market has been monopolized by only five large corporations such as Carl Zeiss and FEI since 1980 when Hitach, Japan, first commercialized the instrument. And this state-of-art device requires a wide range of basic science and source technologies. Recently, a Korean venture business succeeded in developing and is now preparing for launching an FE-SEM. It has image resolution and processing speed comparable to foreign products and features auto-stepping, a patented technology that will enhance the product’s competitiveness.

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